SEMICONDUCTOR RELIABILITY CHALLENGES IN ELECTRIC AND AUTONOMOUS VEHICLES: A SYSTEMATIC REVIEW

Abstract

The rapid adoption of electric vehicles (EVs) and autonomous vehicles (AVs) has significantly increased the dependence of automotive systems on advanced semiconductor technologies. These semiconductors must operate reliably under prolonged electrical, thermal, and environmental stress while supporting safety-critical vehicle functions. Unlike conventional automotive electronics, EV and AV platforms demand continuous operation, high power density, and complex system integration, which introduce new reliability challenges. This paper presents a systematic review of recent research addressing semiconductor reliability in electric and autonomous vehicles. Key challenges related to device aging, functional safety compliance, architectural complexity, and qualification limitations are analyzed. The review further highlights emerging research trends and outlines technical directions required to enhance long-term reliability in next-generation automotive semiconductor systems.